Published in
IOP Publishing, Chinese Physics Letters, 7(35), p. 078502
DOI: 10.1088/0256-307x/35/7/078502
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Total Ionizing Dose Effects of 55-nm Silicon-Oxide-Nitride-Oxide-Silicon Charge Trapping Memory in Pulse and DC Modes
Journal article published in 2018 by
Mei Li,
Jin-Shun Bi,
Yan-Nan Xu,
Bo Li,
Kai Xi,
Hai-Bin Wang,
Jing-Liu,
Jin-Li,
Lan-Long Ji,
Li Luo,
Ming Liu
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