Published in
IOP Publishing, Chinese Physics B, 7(27), p. 078501
DOI: 10.1088/1674-1056/27/7/078501
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Dependence of single event upsets sensitivity of low energy proton on test factors in 65 nm SRAM
Journal article published in 2018 by
Yin-Yong Luo,
Feng-Qi Zhang,
Xiao-Yu Pan,
Hong-Xia Guo,
Yuan-Ming Wang
This paper was not found in any repository, but could be made available legally by the author.
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