Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 4(25), p. 1397-1407
DOI: 10.1109/tvlsi.2016.2626218
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Coarse-Grained Online Monitoring of BTI Aging by Reusing Power-Gating Infrastructure
Journal article published in 2017 by
Vasileios Tenentes 
,
Daniele Rossi,
Sheng Yang,
Saqib Khursheed,
Bashir M. Al-Hashimi,
Steve R. Gunn
,
Daniele Rossi,
Sheng Yang,
Saqib Khursheed,
Bashir M. Al-Hashimi,
Steve R. Gunn
This paper was not found in any repository, but could be made available legally by the author.
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