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Springer Verlag, International Journal of Advanced Manufacturing Technology

DOI: 10.1007/s00170-018-2331-0

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A method for inspecting near-right-angle V-groove surfaces based on dual-probe wavelength scanning interferometry

Journal article published in 2018 by Tao Zhang, Feng Gao, Haydn Martin, Xiangqian Jiang
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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