Published in
Springer (part of Springer Nature), Acta Mechanica Sinica, 5(32), p. 805-812
DOI: 10.1007/s10409-016-0591-1
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Measurement of residual stress in a multi-layer semiconductor heterostructure by micro-Raman spectroscopy
Journal article published in 2016 by
Wei Qiu,
Cui-Li Cheng,
Ren-Rong Liang,
Chun-Wang Zhao,
Zhen-Kun Lei,
Yu-Cheng Zhao,
Lu-Lu Ma,
Jun Xu,
Hua-Jun Fang,
Yi-Lan Kang
This paper was not found in any repository, but could be made available legally by the author.
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