Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Nuclear Science, 3(57), p. 1640-1643, 2010
Links
Tools
Radiation Hardness of ${\rm TiO}_{2}$ Memristive Junctions
Journal article published in 2010 by
William M. Tong,
J. Joshua Yang,
Philip J. Kuekes,
Duncan R. Stewart,
R. Stanley Williams,
Erica DeIonno,
Everett E. King,
Steven C. Witczak,
Mark D. Looper 
,
Jon V. Osborn
,
Jon V. Osborn
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
Published version:
archiving forbidden
Data provided by 
