Published in
Institute of Electrical and Electronics Engineers, IEEE Sensors Journal, 10(14), p. 3557-3566, 2014
DOI: 10.1109/jsen.2014.2328621
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Characterization Measurements Methodology and Instrumental Set-Up Optimization for New SiPM Detectors—Part I: Electrical Tests
Journal article published in 2014 by
Giovanni Bonanno 
,
Davide Marano,
Massimiliano Belluso,
Sergio Billotta,
Alessandro Grillo,
Salvatore Garozzo,
Giuseppe Romeo,
Maria Cristina Timpanaro
,
Davide Marano,
Massimiliano Belluso,
Sergio Billotta,
Alessandro Grillo,
Salvatore Garozzo,
Giuseppe Romeo,
Maria Cristina Timpanaro
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