Published in
Wiley, Rapid Communications in Mass Spectrometry, 14(34), 2020
DOI: 10.1002/rcm.8803
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UV post‐ionization laser ablation ionization mass spectrometry for improved nm‐depth profiling resolution on Cr/Ni reference standard
Journal article published in 2020 by
Valentine Grimaudo 
,
Marek Tulej,
Andreas Riedo ,
Rustam Lukmanov,
Niels F. W. Ligterink ,
Coenraad Koning,
Peter Wurz
,
Marek Tulej,
Andreas Riedo ,
Rustam Lukmanov,
Niels F. W. Ligterink ,
Coenraad Koning,
Peter Wurz
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