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Advances in Computational Methods for X-Ray and Neutron Optics, 2004

DOI: 10.1117/12.583232

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Fitting X-ray multilayer reflectivities by means of the PPM code

Proceedings article published in 2004 by Daniele Spiga, Alessandro Mirone, Claudio Ferrero, Vincenzo Cotroneo, Giovanni Pareschi ORCID, Manuel Sanchez del Rio, Dervis Vernani
This paper was not found in any repository; the policy of its publisher is unknown or unclear.
This paper was not found in any repository; the policy of its publisher is unknown or unclear.

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