Published in
IOP Publishing, Journal of Instrumentation, 07(12), p. C07012-C07012, 2017
DOI: 10.1088/1748-0221/12/07/c07012
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Radiation Hardness tests with neutron flux on different Silicon photomultiplier devices
Journal article published in 2017 by
P. W. Cattaneo 
,
T. Cervi,
A. Menegolli,
M. Oddone,
M. Prata,
M. C. Prata,
M. Rossella
,
T. Cervi,
A. Menegolli,
M. Oddone,
M. Prata,
M. C. Prata,
M. Rossella
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