Published in
AIP Publishing, Review of Scientific Instruments, 12(90), p. 123107, 2019
DOI: 10.1063/1.5116717
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A transition-edge sensor-based x-ray spectrometer for the study of highly charged ions at the National Institute of Standards and Technology electron beam ion trap
Journal article published in 2019 by
P. Szypryt 
,
G. C. O’Neil ,
E. Takacs,
J. N. Tan,
S. W. Buechele,
A. S. Naing,
D. A. Bennett ,
W. B. Doriese ,
M. Durkin,
J. W. Fowler,
J. D. Gard ,
G. C. Hilton,
K. M. Morgan ,
C. D. Reintsema,
D. R. Schmidt
and other authors.
,
G. C. O’Neil ,
E. Takacs,
J. N. Tan,
S. W. Buechele,
A. S. Naing,
D. A. Bennett ,
W. B. Doriese ,
M. Durkin,
J. W. Fowler,
J. D. Gard ,
G. C. Hilton,
K. M. Morgan ,
C. D. Reintsema,
D. R. Schmidt
and other authors.
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
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