Published in
2010 IEEE International Reliability Physics Symposium, 2010
DOI: 10.1109/irps.2010.5488797
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Scaling trends of neutron effects in MLC NAND Flash memories
Proceedings article published in 2010 by
S. Gerardin,
M. Bagatin,
A. Paccagnella,
G. Cellere,
A. Visconti,
S. Beltrami,
C. Andreani,
G. Gorini 
,
C. D. Frost
,
C. D. Frost
