Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Device and Materials Reliability, 2(12), p. 437-444, 2012
DOI: 10.1109/tdmr.2012.2192440
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Neutron-Induced Upsets in NAND Floating Gate Memories
Journal article published in 2012 by
Simone Gerardin,
Marta Bagatin,
Alberto Ferrario,
Alessandro Paccagnella,
Angelo Visconti,
Silvia Beltrami,
Carla Andreani,
Giuseppe Gorini 
,
Christopher D. Frost
,
Christopher D. Frost
This paper was not found in any repository, but could be made available legally by the author.
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