Published in
Multilayer and Grazing Incidence X-Ray/EUV Optics III, 1996
DOI: 10.1117/12.245108
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Analysis of iridium reflectance measurements for AXAF witness mirrors from 2 to 12 keV
Proceedings article published in 1996 by
Jonathan J. Fitch,
Dale E. Graessle,
Bernard Harris,
John P. Hughes 
,
Dan T. Nguyen,
Daniel A. Schwartz,
Richard L. Blake
,
Dan T. Nguyen,
Daniel A. Schwartz,
Richard L. Blake
