Published in
IOP Publishing, Journal of Instrumentation, 09(13), p. P09011-P09011, 2018
DOI: 10.1088/1748-0221/13/09/p09011
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Characterization of a novel pixelated Silicon Drift Detector (PixDD) for high-throughput X-ray astrophysics
Journal article published in 2018 by
Y. Evangelista,
F. Ambrosino 
,
M. Feroci,
P. Bellutti,
G. Bertuccio,
G. Borghi,
R. Campana ,
M. Caselle,
D. Cirrincione,
F. Ficorella,
M. Fiorini,
F. Fuschino,
M. Gandola,
M. Grassi,
C. Labanti
and other authors.
,
M. Feroci,
P. Bellutti,
G. Bertuccio,
G. Borghi,
R. Campana ,
M. Caselle,
D. Cirrincione,
F. Ficorella,
M. Fiorini,
F. Fuschino,
M. Gandola,
M. Grassi,
C. Labanti
and other authors.
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
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