Published in
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC)
DOI: 10.1109/isemc.2018.8393868
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Dielectric constant and loss-tangent extraction using near-field technology and phase delay method
Proceedings article published in 2018 by
Sung-Mao Wu,
Sheng-Wei Guan,
Cheng-Dao Li,
Li-Xuan Tsai,
Chun-Ting Kuo,
Ming-Kun Hsieh,
Chia-Hung Su
