Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Terahertz Science & Technology, 3(8), p. 257-270, 2018
DOI: 10.1109/tthz.2018.2814347
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Advanced Terahertz Frequency-Domain Ellipsometry Instrumentation for In Situ and Ex Situ Applications
Journal article published in 2018 by
Philipp Kuhne 
,
Nerijus Armakavicius ,
Vallery Stanishev ,
Craig M. Herzinger,
Mathias Schubert ,
Vanya Darakchieva
,
Nerijus Armakavicius ,
Vallery Stanishev ,
Craig M. Herzinger,
Mathias Schubert ,
Vanya Darakchieva
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