Published in
Optical Society of America, Optics Letters, 23(24), p. 1732, 1999
DOI: 10.1364/ol.24.001732
Links
Tools
Deconvolution of local surface response from topography in nanometer profilometry with a dual-scan method
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
Published version:
archiving forbidden
Data provided by 
