Published in
Institute of Electrical and Electronics Engineers (IEEE), IEEE Access, (7), p. 51276-51283, 2019
DOI: 10.1109/access.2019.2910845
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Total Ionizing Dose Hardening of 45 nm FD-SOI MOSFETs Using Body-Tie Biasing
Journal article published in 2019 by
Xiaoqiang Liu 
,
Li Cai,
Baojun Liu,
Xiaokuo Yang,
Huanqing Cui,
Cheng Li
,
Li Cai,
Baojun Liu,
Xiaokuo Yang,
Huanqing Cui,
Cheng Li
This paper is made freely available by the publisher.
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