Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Nuclear Science, 4(66), p. 710-715, 2019
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Numerical and Experimental Investigation of TID Radiation Effects on the Breakdown Voltage of 400-V SOI NLDMOSFETs
Journal article published in 2019 by
Lei Shu 
,
Liang Wang ,
Xin Zhou,
Tong-De Li,
Zhang-Yi'an Yuan,
Cheng-Long Sui,
Yuan Li,
Bi Wang,
Yuan-Fu Zhao,
Kenneth F. Galloway
,
Liang Wang ,
Xin Zhou,
Tong-De Li,
Zhang-Yi'an Yuan,
Cheng-Long Sui,
Yuan Li,
Bi Wang,
Yuan-Fu Zhao,
Kenneth F. Galloway
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