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Institute of Electrical and Electronics Engineers (IEEE), IEEE Access, (7), p. 11997-12005, 2019

DOI: 10.1109/access.2019.2892060

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A Black-Box External Equivalent Method Using Tie-Line Power Mutation

Journal article published in 2019 by Wei Yan, Chao Zhang ORCID, Junjie Tang, Wei Qian, Shiming Li, Qian Wang
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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