Published in
Springer (part of Springer Nature), Journal of Electronic Testing, 2(35), p. 261-267, 2019
DOI: 10.1007/s10836-019-05788-x
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Impact of Bias Temperature Instability (BTI) Aging Phenomenon on Clock Deskew Buffers
Journal article published in 2019 by
Marco Grossi 
,
Martin Omaña
,
Martin Omaña
This paper was not found in any repository, but could be made available legally by the author.
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