Published in
Wiley, SID Symposium Digest of Technical Papers, 1(48), p. 68-71
DOI: 10.1002/sdtp.11561
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7-2: Design of Highly Reliable Depletion-Mode a-IGZO TFT Gate Driving Circuit for 31-in. 8K4K 287-ppi TFT-LCD
Journal article published in 2017 by
Long-Qiang Shi,
Shu-Jhih Chen,
Yi-Fang Chou,
Li-Mei Zeng,
Mian Zeng,
Tian-Hong Wang,
Ren-Lu Chen,
Cong-Wei Liao,
Xiao-Wen Lv,
Wen-Ying Li,
X. Liu,
Chia-Yu Lee
This paper was not found in any repository, but could be made available legally by the author.
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