easySLM-STED: Stimulated emission depletion microscopy with aberration correction, extended field of view and multiple beam scanning
Journal article published in 2018 by
Frederik Görlitz 
,
Stina Guldbrand,
Timothy H. Runcorn,
Robert T. Murray,
Angel L. Jaso-Tamame,
Hugo G. Sinclair,
Enrique Martinez-Perez,
James R. Taylor,
Mark A. A. Neil,
Christopher Dunsby,
Paul M. W. French
,
Stina Guldbrand,
Timothy H. Runcorn,
Robert T. Murray,
Angel L. Jaso-Tamame,
Hugo G. Sinclair,
Enrique Martinez-Perez,
James R. Taylor,
Mark A. A. Neil,
Christopher Dunsby,
Paul M. W. French
This paper is made freely available by the publisher.
Full text: Download
Preprint: archiving forbidden
Published version:
archiving forbidden
Data provided by 
